Apparatus and method for testing driver writeability strength on an integrated circuit
AssigneeApple Inc.
InventorsAshish R. Jain, Edgardo F. Klass
Life of this patent
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AssigneeApple Inc.
InventorsAshish R. Jain, Edgardo F. Klass
Estimating the term…
An apparatus and method for testing driver write-ability strength on an integrated circuit includes one or more drive detection units each including a number of drivers. At least some of the drivers may have a different drive strength and each may drive a voltage onto a respective driver output line. Each drive detection unit may include a number of keeper circuits, each coupled to a separate output line and configured to retain a given voltage on the output line to which it is coupled. Each detection unit may also include a number of detection circuits coupled to detect the drive voltage on each of the output lines. In one implementation, the drive voltage appearing at the output line of each driver may be indicative of that the driver was able to overdrive the voltage being retained on the output line to which it is coupled by the respective keeper circuits.
An integrated circuit comprising:
A drive detection unit comprising:
A method comprising:
Dependencies are inferred from the claim text.