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US 8,946,672 B2Granted
Resistance changing element capable of operating at low voltage, semiconductor device, and method for forming resistance change element
AssigneeNEC Corporation
InventorsMunehiro Tada, Koichiro Okamoto, Toshitsugu Sakamoto, Hiromitsu Hada
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Abstract
A resistance changing element according to the present invention comprises a first electrode (101) and a second electrode (103); and an ion conducting layer (102) that is formed between the first electrode (101) and the second electrode (103) and that contains at least oxygen and carbon.
Claims10
A resistance changing element comprising:
- a first electrode and a second electrode;
- and
- an ion conducting layer that is formed between said first electrode and said second electrode and that contains at least oxygen and carbon,
- wherein said ion conducting layer is a porous film that contains at least silicon as well as said oxygen and said carbon:
- said ion conducting layer is a film that contains a six-membered ring-shaped siloxane structure or an eight-membered ring-shaped siloxane structure;
- said ion conducting layer is a film that contains at least an unsaturated hydrocarbon group;
- said ion conducting layer has a relative permittivity of 2.5 to 3.5 and a single peak distribution of hole diameters;
- said ion conducting layer includes at least an organic silica compound;
- and
- said organic silica compound has a structure expressed by any one of Chemical Formulas that follow and R1 is a vinyl group and R2 is anyone from among hydrogen, methyl group, ethyl group, propyl group and isopropyl group;
7 more elements
Dependencies are inferred from the claim text.