Radiation detector, method of manufacturing radiation detector, and radiographic image capturing apparatus incorporating radiation detector

A method of manufacturing a radiation detector including a scintillator for converting radiation into visible light and photodiodes for converting the visible light into electric charges, comprising the steps of:

• measuring a temperature-dependent rate of change in sensitivity of the scintillator with respect to the radiation;
• and
• if it is assumed that the temperature-dependent rate of change in sensitivity of the scintillator with respect to the radiation is represented by A [%/K], selecting, as the photodiodes, photodiodes having a temperature-dependent rate of change B [%/K] in sensitivity with respect to the visible light that satisfies the following inequality (1):
• −0.35 [%/K]<A+B<0.35 [%/K] (1).

A method of manufacturing a radiation detector including a scintillator for converting radiation into visible light and photodiodes for converting the visible light into electric charges, comprising the steps of:

• measuring a temperature-dependent rate of change in sensitivity of the photodiodes with respect to the visible light;
• and
• if it is assumed that the temperature-dependent rate of change in sensitivity of the photodiodes with respect to the visible light is represented by B [%/K], selecting, as the scintillator, a scintillator having a temperature-dependent rate of change A [%/K] in sensitivity with respect to the radiation that satisfies the following inequality (1):
• −0.35 [%/K]<A+B<0.35 [%/K] (1).

A radiographic image capturing apparatus comprising a housing and a radiation detector accommodated in the housing, the radiation detector including a scintillator for converting radiation into visible light and photodiodes for converting the visible light into electric charges, wherein:

• the housing has an irradiated surface facing a radiation source;
• if it is assumed that a temperature-dependent rate of change in sensitivity of the scintillator with respect to the radiation is represented by A [%/K] and a temperature-dependent rate of change in sensitivity of the photodiodes with respect to visible light is represented by B [%/K], the temperature-dependent rates of change A and B satisfy the following inequality (1):
• −0.35 [%/K]<A+B<0.35 [%/K] (1);
• and
• the radiation detector is mounted on a surface of the housing that is opposite to the irradiated surface.