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US 8,945,937 B2Granted
Apparatus and method for analyzing graphene and graphene boundary
AssigneeSamsung Electronics Co., Ltd.
InventorsYoung-hee Lee, Gang-hee Han, Dinh Loc Duong
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Abstract
A method of analyzing graphene includes providing a first graphene structure including graphene having grains and grain boundaries, and a support portion for supporting the graphene, generating a second graphene structure by oxidizing the first graphene structure, and detecting a shape of the graphene.
Claims23
A method of analyzing graphene, the method comprising:
- providing a first graphene structure including,
- graphene having grains and grain boundaries, and
- a support portion for supporting the graphene;
- generating a second graphene structure by oxidizing the first graphene structure;
- and
- detecting a shape of the graphene.
3 more elements
An apparatus for analyzing a graphene structure comprising:
- an oxidization unit configured to receive the graphene structure including graphene and a support portion for supporting the graphene, the graphene including grains and grain boundaries, and form oxides by oxidizing parts of the support portion corresponding to the grain boundaries of the graphene;
- and
- a graphene shape detection unit configured to detect a shape of the graphene after the graphene structure has been oxidized by the oxidation unit.
A graphene structure comprising:
- graphene including grains and grain boundaries;
- a support portion supporting the graphene;
- and
- an oxide in a part of the support portion abutting the grain boundaries.
1 more element
Dependencies are inferred from the claim text.