Device for internal flaw magnification during wire drawing

A device for use as an adjunct in assuring that a manufactured wire is substantially free of internal flaws comprising:

• a plurality of successively adjacent wire bending stations, each station comprising on a first plane, a means for bending the wire into a second bending plane substantially parallel to the first plane, wherein the first plane and second bending plane are different for each station;
• and
• means for passing the wire through the successive stations;
• whereby the different bending plane at each station subjects the wire at each station to tensile bending strain at portions of the wire cross-section which are different for each station, whereby the probability is increased that a given internal flaw in the wire will be exposed to the tensile bending strain condition as the wire passes through the successive stations, increasing likelihood of breakage of the wire at the flaw or of flaw magnification to improve detection of the flaw during subsequent wire inspections.