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AssigneeInternational Business Machines Corporation
InventorsNathaniel R. Chadwick, Frances S. M. Clougherty, William P. Hovis, Kirk D. Peterson, Mack W. Riley
Estimating the term…
Various embodiments include approaches for determining burn-in workload conditions for an integrated circuit (IC) design. Some embodiments include burn-in testing the IC design using the workload conditions. In some embodiments, a computer implemented method includes obtaining survey data about at least one application workload for an integrated circuit (IC) corresponding to an IC design; generating latch state and clocking statistics about the IC design for the at least one application workload based upon the survey data; and determining a set of burn-in workload conditions for the IC design based upon the latch state and clocking statistics about the IC design.
A computer-implemented method, performed on at least one computing device, the computer-implemented method comprising:
A system comprising:
A computer program product comprising program code stored on a non-transitory computer-readable medium, which when executed by at least one computing device, causes the at least one computing device to:
Dependencies are inferred from the claim text.