Analysis support computer product, apparatus, and method
AssigneeFujitsu Limited
InventorKatsumi Homma
Life of this patent
Estimating the term…
Abstract
A computer-readable, non-transitory medium stores a program that causes a computer to execute a process including acquiring a unique coefficient that is unique to a device in a circuit under test and is included in a function expressing fluctuation of leak current of the device; detecting as a group and based on the unique coefficient, devices having an identical or similar characteristic; converting first random variables into a single second random variable, the first random variables expressing fluctuation of leak current unique to each of the detected devices; yielding a function that expresses fluctuation of leak current of the detected devices, using the second random variable; and outputting the yielded function.
Claims9
A computer-readable, non-transitory medium storing a program causing a computer to execute a process, the process comprising:
- acquiring a unique coefficient that is unique to a device in a circuit under test and is included in a function expressing fluctuation of leak current of the device;
- detecting as a group, and based on the unique coefficient, devices having an identical type and having a difference in driving capability that falls within a given range;
- converting first random variables into a single second random variable, the first random variables expressing fluctuation of leak current unique to each of the detected devices;
- yielding a function that expresses fluctuation of leak current of the detected devices, using the second random variable;
- and
- outputting the yielded function.
An analysis support apparatus comprising:
- an acquiring unit that acquires a unique coefficient that is unique to a device in a circuit under test and is included in a function expressing fluctuation of leak current of the device;
- a detecting unit that detects as a group, and based on the unique coefficient, devices having an identical type and having a difference in driving capability that falls within a given range;
- a converting unit that converts first random variables into a single second random variable, the first random variables expressing fluctuation of leak current unique to each of the detected devices;
- a yielding unit that yields a function that expresses fluctuation of leak current of the detected devices, using the second random variable;
- and
- an output unit that outputs the yielded function.
An analysis support apparatus comprising:
- a processor to execute a procedure, the procedure comprising:
- acquiring a unique coefficient that is unique to a device in a circuit under test and is included in a function expressing fluctuation of leak current of the device;
- detecting as a group, and based on the unique coefficient, devices having an identical type and having a difference in driving capability that falls within a given range;
- converting first random variables into a single second random variable, the first random variables expressing fluctuation of leak current unique to each of the detected devices;
- yielding a function that expresses fluctuation of leak current of the detected devices, using the second random variable;
- and
- outputting the yielded function.
An analysis support method comprising:
- acquiring a unique coefficient that is unique to a device in a circuit under test and is included in a function expressing fluctuation of leak current of the device;
- detecting as a group, and based on the unique coefficient, devices having an identical type and having a difference in driving capability that falls within a given range;
- converting first random variables into a single second random variable, the first random variables expressing fluctuation of leak current unique to each of the detected devices;
- yielding a function that expresses fluctuation of leak current of the detected devices, using the second random variable;
- and
- outputting the yielded function.
Dependencies are inferred from the claim text.