Determining transistor leakage for an integrated circuit

A method, comprising:

• a processor obtaining a base estimate of power consumed by transistor leakage of the processor;
• and
• the processor scaling the base estimate based on a performance state of the processor and a temperature of the processor, wherein the performance state is a performance state in accordance with an Advanced Configuration and Power Interface (ACPI) standard.

A non-transitory computer readable medium comprising a data structure which is operated upon by a program executable on a computer system, the program operating on the data structure to perform a portion of a process to fabricate an integrated circuit including circuitry described by the data structure, the circuitry described in the data structure including:

• a power monitor unit configured to receive a temperature of the integrated circuit and an indication of a performance state at which the integrated circuit operates, wherein the performance state is a performance state in accordance with an Advanced Configuration and Power Interface (ACPI) standard;
• wherein the power monitor unit is configured to determine an estimate of power consumed by transistor leakage of the integrated circuit, wherein the estimate is based on the received temperature and the performance state.