Variable resistance nonvolatile memory element writing method
AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsKoji Katayama, Satoru Mitani, Takeshi Takagi
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AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsKoji Katayama, Satoru Mitani, Takeshi Takagi
Estimating the term…
A variable resistance nonvolatile memory element writing method according to the present disclosure includes: (a) changing a variable resistance layer to a low resistance state by applying, to a second electrode, a first voltage which is negative with respect to a first electrode; and (b) changing the variable resistance layer to a high resistance state. Step (b) includes: (i) applying, to the second electrode, a second voltage which is positive with respect to the first electrode; and (ii) changing the variable resistance layer to the high resistance state by applying, to the second electrode, a third voltage, which is negative with respect to the first electrode and is smaller than the absolute value of a threshold voltage for changing the variable resistance layer from the high resistance state to the low resistance state, after the positive second voltage is applied in step (i).
A variable resistance nonvolatile memory element writing method for writing data to a variable resistance nonvolatile memory element including a first electrode, a second electrode, and a variable resistance layer which is disposed between the first electrode and the second electrode, is in contact with the first electrode and the second electrode, and reversibly changes between two resistance states consisting of a high resistance state and a low resistance state, according to an electrical signal applied between the first electrode and the second electrode,
A variable resistance nonvolatile memory element comprising:
Dependencies are inferred from the claim text.