Semiconductor device
AssigneeRenesas Electronics Corporation
InventorOsamu Souma
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AssigneeRenesas Electronics Corporation
InventorOsamu Souma
Estimating the term…
A first overcurrent detection unit detects whether a drain-source voltage of an output transistor is greater than or equal to a first reference value and outputs a first detection signal. A second overcurrent detection unit detects whether an output current passing through the output transistor is greater than or equal to a second reference value and outputs a second detection signal. When receiving the first detection signal indicating that the drain-source voltage is greater than or equal to the first reference value, a latch circuit latches the second detection signal; when receiving the first detection signal indicating that the drain-source voltage is smaller than the first reference value, the latch circuit outputs the second detection signal without latching it. Based on the output of the latch circuit, the drive circuit controls the output transistor to either turn it off or turn it on and off alternately.
A semiconductor device comprising:
A method for operating a semiconductor device, comprising:
Dependencies are inferred from the claim text.