Microparticle measurement apparatus and microparticle analysis method
AssigneeSony Corporation
InventorsShunpei Suzuki, Gakuji Hashimoto
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AssigneeSony Corporation
InventorsShunpei Suzuki, Gakuji Hashimoto
Estimating the term…
There is provided a microparticle measurement apparatus including a first light source configured to irradiate excitation light on a droplet containing a microparticle, the droplet being discharged from an orifice, a second light source configured to irradiate illumination light on the droplet for acquiring an image of the droplet, a light receiving element configured to detect fluorescence generated from the microparticle due to the irradiation of the excitation light, and to acquire an image of the droplet, and a filter member configured to be arranged between the droplet and the light receiving element. The filter member includes a first area through which the fluorescence and the illumination light pass, and a second area that is provided around the first area and that has a wavelength selectivity which lets the fluorescence pass through but blocks the illumination light.
A microparticle measurement apparatus comprising:
A microparticle analysis method comprising:
Dependencies are inferred from the claim text.