Pattern forming method, actinic-ray-sensitive or radiation-sensitive resin composition, and resist film
AssigneeFUJIFILM Corporation
InventorShuhei Yamaguchi
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AssigneeFUJIFILM Corporation
InventorShuhei Yamaguchi
Estimating the term…
Provided is a pattern forming method that is excellent in resolving power such as pre-bridging dimension, a roughness performance such as line edge roughness, and development time dependency, and an actinic-ray-sensitive or radiation-sensitive resin composition and a resist film used for the pattern forming method. The pattern forming method includes (1) forming a film using an actinic-ray-sensitive or radiation-sensitive resin composition that contains a resin (A) and a compound (B) which has a polymerizable group and generates an acid by being irradiated with actinic rays or radiations; (2) exposing the film; and (3) developing the exposed film using a developer that contains an organic solvent, wherein a pattern formed in this method is a negative pattern.
A pattern forming method comprising:
A pattern forming method comprising:
A pattern forming method comprising:
Dependencies are inferred from the claim text.