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US 8,940,093 B2Granted
Method of controlling an epitaxial growth process in an epitaxial reactor
AssigneeTexas Instruments Incorporated
InventorsManfred Schiekofer, Pietro Foglietti, Robert Maier
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Abstract
A method of controlling an epitaxial growth process in an epitaxial reactor. The method includes optimizing the thermocouple offset parameter for a second run by setting up a modeled output parameter value as a linear function of the actual output parameter value, and a second thermocouple offset parameter value.
Claims4
A method of controlling an epitaxial growth process in an epitaxial reactor, the method comprising:
- performing a first run of the epitaxial growth process, and controlling a temperature of the first run of the epitaxial growth process with a temperature measuring device that determines the temperature based on a first thermocouple offset parameter value;
- optimizing the thermocouple offset parameter for a second run by the steps of:
- measuring an actual output parameter value of the epitaxial growth process of the first run;
- setting up a modeled output parameter value as a linear function of the actual output parameter value, and a second thermocouple offset parameter value;
- determining a distance between a target output parameter value and the modeled output parameter value;
- determining the second thermocouple offset parameter value as a thermocouple offset parameter value that provides the minimum distance between the modeled output parameter value and the target parameter value;
- and
- performing a second run of the epitaxial growth process, and controlling a temperature of the epitaxial growth process during the second run by a temperature measuring device that determines the temperature based on the second thermocouple offset parameter value.
5 more elements
Dependencies are inferred from the claim text.