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US 8,939,917 B2Granted
Methods and devices for quantitative analysis of bone and cartilage
AssigneeImaTx, Inc.
InventorRene Vargas-Voracek
Life of this patent
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Abstract
A method for measuring cartilage defects within a subject includes surgically exposing a joint or cartilage surface. The exposed joint or cartilage surface having at least one defect, and the method may generating a cast of the at least one defect. The method may also include measuring a parameter of the cast, thereby estimating a characteristic of the defect.
Claims19
A method for evaluating accuracy of an image analysis process for indirect measurements of parameters associated with a cartilage defect of a joint using image data of the joint, comprising:
- generating a physical model of the cartilage defect from the joint, wherein the physical model includes a wax model;
- deriving a volume of the cartilage defect from the wax model using fluid displacement;
- comparing the volume to a corresponding parameter of the cartilage defect, wherein the corresponding parameter is derived from the image data of the joint, and
- determining the accuracy of the image analysis process for deriving the corresponding parameter.
1 more element
Dependencies are inferred from the claim text.