Electrical hotspot detection, analysis and correction

A method of electrical hotspot detection and correction, comprising:

• with a computer,
• receiving information of a circuit design and a layout design for an integrated circuit, and information of electrical constraints, the circuit design comprising one or more analog circuits, the electrical constraints being associated with the electrical behavior of one or more analog electrical devices employed by the integrated circuit, analog device instances of the one or more analog electrical devices being linked to corresponding geometric features in the layout design;
• extracting layout parameters for the analog device instances;
• computing electrical parameter variations for the analog device instances based on the extracted layout parameters to identify one or more electrical hotspots in one or more of the analog device instances in the layout design;
• performing sensitivity analysis of the one or more electrical hotspots to generate repair hints, the sensitivity analysis including analysis of the effect of mechanical stress due to at least one of well proximity or shallow trench isolation on the electrical behavior of the one or more analog device instances, the repair hints including one or more diffusion edge modifications of the respective one or more analog device instances associated with the one or more electrical hotspots;
• adjusting the layout design based on the repair hints;
• and
• outputting the adjusted layout design.

One or more non-transitory processor-readable storage media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:

• receiving information of a circuit design and a layout design for an integrated circuit, and information of user-defined electrical constraints, the circuit design comprising one or more analog circuits, the user-defined electrical constraints being associated with the electrical behavior of one or more analog electrical devices employed by the integrated circuit, analog device instances of the one or more analog electrical devices being linked to corresponding geometric features in the layout design;
• extracting layout parameters for the analog device instances;
• computing electrical parameter variations for the analog device instances based on the extracted layout parameters and the user-defined electrical constraints to identify one or more electrical hotspots in one or more of the analog device instances in the layout design;
• performing sensitivity analysis of the one or more electrical hotspots to generate repair hints, the sensitivity analysis including analysis of the effect of mechanical stress due to at least one of well proximity or shallow trench isolation on the electrical behavior of the one or more analog device instances, the repair hints being configured to bring the electrical behavior of the analog device instances within the user-defined electrical constraints while reducing changes to the layout design, the repair hints including one or more diffusion edge modifications of the respective one or more analog device instances associated with the one or more electrical hotspots;
• adjusting the layout design based on the repair hints;
• and
• outputting the adjusted layout design.