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US 8,914,254 B2Granted
Latency measurement
AssigneeMicrosoft Corporation
InventorsAleksandar Uzelac, David A. Stevens, Andrey B. Batchvarov, Changsin Lee, Takahiro Shigemitsu
Life of this patent
Estimating the term…
Abstract
Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
Claims20
A test apparatus comprising:
- one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as movement;
- and
- one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
A method comprising:
- moving one or more contacts, by one or more motors, at least proximal to one or more sensors of a device to be detectable as movement;
- and
- measuring latency of the device to recognize the movement of the one or more contacts by one or more modules implemented at least partially in hardware.
Dependencies are inferred from the claim text.