Signal processing in guided wave cutoff spectroscopy
AssigneeThermo Ramsey Corporation
InventorTom Lee Erb
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AssigneeThermo Ramsey Corporation
InventorTom Lee Erb
Estimating the term…
The present invention includes a guided microwave spectroscopy system (1) that eliminates the need for an automatic gain control feature by providing multiple signal processing paths having differing fixed voltage gains. An emitted signal which exits a test chamber (2) containing a material under test is simultaneously amplified by at least a first fixed gain amplifier (4) and a second fixed gain amplifier (7). The output signal of each amplifier is separately digitized and then normalized for further digital signal processing by a computer (13) in order to determine parameters of the material under test which may have variable microwave radiation characteristics that are a function of the frequency of the signal emitted into the test chamber. During the signal processing step a system clock (121) causes the computer to sample only an integral number of complete output signal cycles. A calibration protocol (136-154) is conducted based on laboratory samples of each potential material to be processed by the system (1).
A system for processing a signal received while operating a guided microwave spectroscopy device, comprising:
A guided microwave spectroscopy signal processing device, comprising:
A method of processing an electromagnetic signal produced in response to electro-magnetic characterization of an object by a variable frequency oscillator, comprising the steps of:
Dependencies are inferred from the claim text.