Developing device and image forming apparatus having developer layer regulating member
AssigneeOki Data Corporation
InventorJunichi Kawashima
Life of this patent
Estimating the term…
Abstract
A developing device includes a developer supporting member having an elastic layer and a surface layer covering the elastic layer for supporting developer; and a developer layer regulating member arranged to abut against the surface layer for regulating a layer thickness of the developer on the surface layer. The surface layer contains at least carbon black. The developer supporting member is configured so that the following equation (1) is satisfied when the surface layer has a dynamic friction coefficient μ between 0.4 and 0.9 (0.4≦μ≦0.9) and a ten-point average roughness Rz (μm) between 2 μm and 6 μm (2≦Rz≦6): 2≦C≦0.5×Rz+3 (1) where C is a content of the carbon black (weight parts relative to the surface layer of 100).
Claims9
A developing device comprising:
- a developer supporting member for supporting developer, said developer supporting member having a surface layer;
- and
- a developer layer regulating member arranged to abut against the surface layer for regulating a layer thickness of the developer on the surface layer,
- wherein said surface layer contains at least carbon black,
- said developer supporting member is composed so that the following equation (1) is satisfied when the surface layer has a dynamic friction coefficient μ between 0.4 and 0.9 (0.4≦μ≦0.9) and a ten-point average roughness Rz (μm) between 2 μm and 6 μm (2≦Rz≦6):
- 2≦C≦0.5×Rz+3 (1)
- where C is a content of the carbon black (weight parts relative to 100 weight parts of a main component of the surface layer), or
- said developer supporting member is composed so that the following equation (2) is satisfied when the surface layer has the dynamic friction coefficient μ and the ten-point average roughness Rz satisfy the following equation (3):
- 0.9≦μ≦0.05×Rz+1 (2)
- 10×μ−7≦C≦0.5×Rz+3 (3)
- where Rz in the equations (1)-(3) represents only a value of the ten-point average roughness Rz of the surface layer expressed in μm.
Dependencies are inferred from the claim text.