Non-volatile memory (NVM) with word line driver/decoder using a charge pump voltage
AssigneeFreescale Semiconductor, Inc.
InventorsPadmaraj Sanjeevarao, David W. Chrudimsky
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AssigneeFreescale Semiconductor, Inc.
InventorsPadmaraj Sanjeevarao, David W. Chrudimsky
Estimating the term…
A word line driver that includes a pull up transistor for biasing a node of a stack of transistors that are located between a high supply voltage terminal and a low supply voltage terminal. The node is biased at a voltage that is between the high supply voltage and the low supply voltage. The stack of transistors includes a stack of decode transistors and a cascode transistor. The cascode transistor is located between the node and a second node of the stack that is coupled to an inverting circuit.
A word line driver comprising:
A word line driver comprising:
Dependencies are inferred from the claim text.
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From the US filing history. Foreign family members aren’t listed.
Arrangements for selecting an address in a digital store: word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down…
Auxiliary circuits, e.g. for writing into memory: address circuits; Decoders; Word-line control circuits
Static stores
About 6 years 5 months of term left · ends 14 Mar 2033 (estimated)
1. Field
This disclosure relates generally to non-volatile memories (NVM), and more specifically, to NVMs that use a charge pump voltage in a word line driver/decoder.
2. Related Art
The present disclosure is illustrated by way of example and is not limited by the accompanying figures, in which like references indicate similar elements. Elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale.
FIG. 1 is a block diagram of an embodiment of a non-volatile memory (NVM) in accordance with the present disclosure;
FIG. 2 is a circuit diagram of a word line driver/decoder of the NVM of FIG. 1; and
In one aspect a word line driver/decoder of a non-volatile memory (NVM) has a series decoder of N channel transistors between a select node and ground in which the select node is brought to a logic low by the N channel transistors all being conductive. Between a charge pump voltage and the select node is a conductive load that is prevented from being a leakage path from the charge pump voltage through the N channel transistors by applying a reference voltage, which may be an external power supply voltage, to the select node. This is better understood by reference to the drawings and the following description.
VB1 is a voltage that limits the amount of current that P channel 32 may conduct to ensure that transistors 38-42 can pull nodes 35 and 39 to a logic low. VB2 is a voltage that makes sure that devices below transistor 34 receive a voltage no greater than a safe voltage for low voltage transistors which means VB2 equals VDD plus a threshold voltage of transistor 34.
Shown in FIG. 1 is a block diagram of a non-volatile memory (NVM) comprising a row pre-decoder 12 that receives a row address, a word line driver/decoder 14 coupled to the row pre-decoder and a word line WL0, a word line driver/decoder 16 coupled to row predecoder 12 and a word line WL1, a memory controller 18 coupled to row predecoder 12 and word line driver/decoders 14 and 16 that has an input/output shown as I/O, a charge pump 19 that is within memory controller 18, column circuitry 20 coupled to memory controller 18 and that receives a column address, and an array 22 coupled to column circuitry 20 and word line driver/decoders 14 and 16 through word lines WL0 and WL1, respectively.