Image display device and method for repairing short circuit failure
AssigneeSony Corporation
InventorsYukihito Iida, Takayuki Taneda, Katsuhide Uchino
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Abstract
The present invention relates to an image display device and a method for repairing a short circuit failure. The present invention is applicable to, for example, an active matrix type image display device using an organic EL device, and a short circuit location between wiring patterns is able to be repaired. In a scanning line WSL or a signal line DTL, a bypass wiring pattern BP for bypassing a region where the signal line DTL and the scanning line WSL intersect with each other is provided. By using the bypass wiring pattern BP, a short circuit location between wiring patterns is repaired.
Claims3
An image display device for displaying an image with the use of a display section in which pixel circuits are arranged in a state of matrix, wherein regarding a scanning line or a signal line of the display section, a wiring pattern is formed in the same layer as that of a wiring pattern of the signal line or the scanning line in regions except for a region where the wiring pattern intersects with the signal line or the scanning line,
- in the intersection region, the wiring pattern is formed in a layer different from that of the wiring pattern of the signal line or the scanning line, and
- the scanning line is provided with a bypass wiring pattern that passes over the wiring pattern of the signal line in an upper layer or a lower layer in a region different from the intersection region, and that bypasses the intersection region,
- wherein the pixel circuit is provided with a writing transistor for setting tone by a voltage of the signal line, and
- a gate of the writing transistor is connected to the scanning line by the bypass wiring pattern.
Dependencies are inferred from the claim text.