System for testing multi-antenna devices using bidirectional faded channels

A wireless test system with a test chamber in which a device under test is tested, comprising:

• a plurality of antennas in the test chamber;
• downlink circuitry coupled to at least some of the antennas, wherein the downlink circuitry is configured to provide predetermined downlink path loss;
• and
• uplink circuitry coupled to at least some of the antennas, wherein the uplink circuitry is configured to provide predetermined uplink path loss, and wherein the uplink circuitry includes an adjustable amplifier circuit and a channel emulator.

A wireless test system for testing a device under test, comprising:

• a test chamber;
• a ring of test antennas within the test chamber that surrounds the device under test, wherein the test antennas in the ring comprise a first group of antennas operable to transmit radio-frequency signals and a second group of antennas operable to receive radio-frequency signals;
• uplink circuitry, wherein the uplink circuitry provides uplink spatial fading and predetermined uplink path loss;
• and
• downlink circuitry, wherein the downlink circuitry provides downlink spatial fading the predetermined downlink path loss.