Semiconductor integrated circuit
AssigneeRenesas Electronics Corporation
InventorsYoshiyuki Amanuma, Takanori Miyoshi
Life of this patent
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Abstract
A semiconductor integrated circuit includes a logic circuit, the logic circuit including an attack detection circuit for checking multi-bit storage. The attack detection circuit includes an error determination circuit capable of detection through a logic operation such as a code theory and a light irradiation detection circuit having light detection elements, and the light detection elements are arranged so that the light irradiation detection circuit can detect errors of the number of bits beyond the detection limit of the error determination circuit. Due to error detection by the error determination circuit and light irradiation detection by the light irradiation detection circuit, the circuits complementarily detect fault attacks from outside.
Claims13
A semiconductor integrated circuit comprising a logic circuit including n storage elements (n is a positive integer) which can each store 1-bit information and an attack detection circuit,
- the attack detection circuit comprising:
- an error determination circuit which can detect through a logic operation that k-bit or less errors (k is a positive integer) have occurred in n-bit codes stored in the n storage elements;
- and
- a light irradiation detection circuit which has light detection elements and can detect that light has been irradiated to (k+1) or more of the n storage elements,
- wherein it is determined that the logic circuit has been attacked from outside when the error determination circuit detects an error or the light irradiation detection circuit detects light irradiation.
A semiconductor integrated circuit comprising a logic circuit including n storage elements (n is a positive integer) which can each store 1-bit information and an attack detection circuit,
- the attack detection circuit comprising an error determination circuit and a light irradiation detection circuit having light detection elements,
- wherein the error determination circuit can detect through a logic operation that k-bit or less errors (k is a positive integer) have occurred in n-bit codes stored in the n storage elements,
- wherein a plurality of areas surrounding arbitrary (k+1) storage elements of the n storage elements, with a minimum closed curve having no inward convex circumference, each contain at least one light detection element, and the light irradiation detection circuit detects light irradiation to (k+1) or more of the n storage elements at the time of detecting that light has been irradiated to at least one of the light detection elements, and
- wherein it is determined that the logic circuit has been attacked from outside when the error determination circuit detects an error or the light irradiation detection circuit detects light irradiation.
Dependencies are inferred from the claim text.