Contactor with multi-pin device contacts
AssigneeTexas Instruments Incorporated
InventorsStanley Hsu, Chi-Tsung Lee, Byron Harry Gibbs
Life of this patent
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AssigneeTexas Instruments Incorporated
InventorsStanley Hsu, Chi-Tsung Lee, Byron Harry Gibbs
Estimating the term…
A contactor assembly for automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode includes a tester load board and a contactor body coupled to the tester load board. A plurality of contactor pins carried by the contactor body includes a first contactor pin and a second contactor pin that are electrically coupled to the tester load board. The tester load board is configured to couple the plurality of contactor pins to automatic test equipment (ATE) for testing the DUT. The first contactor pin and second contactor pin are positioned to both contact the first electrode. A first path to the first contactor pin and a second path to the second contactor pin are electrically shorted together by the contactor assembly to be electrically in parallel to provide redundant paths to the first electrode during automated testing of the DUT.
A contactor assembly for automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode, comprising:
A method of automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode, comprising:
Dependencies are inferred from the claim text.