Electrostatic shielding technique on high voltage diodes
AssigneeHoneywell International Inc.
InventorVasu Mogaveera
Life of this patent
Estimating the term…
Abstract
A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.
Claims20
A DC high potential testing meter comprising:
- a first probe comprising an insulated shield supporting an electrode extending from a distal end of the shield, a high voltage resistor and a high voltage diode in the shield connected in series with the electrode, and a capacitance, formed by a metallic collar, across the high voltage diode to provide uniform voltage distribution along the high voltage diode;
- a second probe comprising an insulated shield supporting an electrode extending from a distal end of the shield and a high voltage resistor connected in series with the electrode;
- and
- a meter operatively connected to the first and second probes comprising a housing enclosing an electrical circuit for measuring voltage across the electrodes and providing an output representing measured voltage.
A DC high potential testing meter comprising:
- a DC probe comprising an insulated shield supporting an electrode extending from a distal end of the shield, a high voltage diode in the shield connected in series with the electrode, and a capacitance, formed by a metallic collar, across the high voltage diode to provide uniform voltage distribution along the high voltage diode;
- a first meter probe comprising an elongate insulated shield having a handle portion at one end and a first high voltage resistor in the shield, the first meter probe being selectively connected to the DC probe whereby the first high voltage resistor is in series with the high voltage diode;
- a second meter probe comprising an elongate insulated shield having a handle portion at one end, an electrode extending from a distal end of the shield, and a high voltage resistor in the shield;
- and
- a meter operatively connected to the first and second meter probes comprising a housing enclosing an electrical circuit for measuring voltage across the electrodes and providing an output representing measured voltage.
Dependencies are inferred from the claim text.