Top gate thin-film transistor, display device, and electronic apparatus

A top gate type thin-film transistor formed on a transparent substrate, comprising:

• a patterned light blocking film,
• a base layer,
• a patterned crystalline silicon film,
• a gate insulating film, and
• a patterned gate electrode film are sequentially laminated on the transparent substrate,
• the patterned crystalline silicon film comprises:
• a channel region overlapping the patterned gate electrode;
• and
• two regions doped with an impurity at low concentration that are in contact with the channel region, and
• the patterned light blocking film is arranged not to overlap the channel region and arranged such that the light blocking film partially overlaps at least any one of the two regions doped with an impurity at low concentration,
• wherein
• the patterned light blocking film comprises a third region that is not located right below the patterned crystalline silicon film, and
• the region on the drain side of the light blocking film and the region on the source side of the light blocking film that are divided across the channel region are electrically connected to each other via the third region of the light blocking film.

A top gate type thin-film transistor formed on a transparent substrate, comprising:

• a patterned light blocking film,
• a base layer,
• a patterned crystalline silicon film,
• a gate insulating film, and
• a patterned gate electrode film sequentially laminated on the transparent substrate,
• wherein the patterned crystalline silicon film comprises:
• a channel region overlapping the patterned gate electrode;
• and
• two regions doped with an impurity at low concentration that are in contact with the channel region,
• wherein the patterned light blocking film is arranged not to overlap the channel region and arranged such that the light blocking film partially overlaps at least any one of the two regions doped with an impurity at low concentration,
• wherein the patterned light blocking film is arranged such that the light blocking film partially overlaps at least any one of a source region and a drain region, and
• wherein the patterned light blocking film is electrically isolated from any one of drain bias, source bias, gate bias and ground that are applied for the top gate type thin-film transistor to operate.