Method of manufacturing semiconductor device
AssigneeMitsubishi Electric Corporation
InventorsKenichiro Kurahashi, Yoshitaka Kamo, Yoshitsugu Yamamoto
Life of this patent
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Abstract
A method of manufacturing a semiconductor device includes forming a first layer on a semiconductor layer, forming a second layer on the first layer, forming a patterned mask on the second layer, etching and removing a portion of the second layer that is not covered by the patterned mask, wet etching the first layer to a width which is less than the width of the patterned mask, after the wet etching, forming an insulating layer on the semiconductor layer, removing the first layer and the second layer to form an opening in the insulating layer, and forming a gate electrode on a surface of the semiconductor layer exposed through the opening.
Claims5
A method of manufacturing a semiconductor device, comprising:
- forming a first layer of SiO on a semiconductor layer;
- forming a second layer of SiN on said first layer;
- forming a patterned mask on said second layer, wherein said patterned mask has a width and covers a portion of said second layer;
- etching and removing the portion of said second layer that is not covered by said patterned mask;
- wet etching said first layer, using a solution containing hydrofluoric acid, to a width which is less than the width of said patterned mask;
- after said wet etching, forming an insulating layer on said semiconductor layer;
- removing said first layer and said second layer to form an opening in said insulating layer;
- and
- forming a gate electrode on a surface of said semiconductor layer exposed through the opening, wherein in said wet etching, etching said first layer is faster than etching said second layer.
A method of manufacturing a semiconductor device, comprising:
- forming a Si oxide layer on a semiconductor layer;
- forming a patterned mask on said Si oxide layer;
- ashing a portion of said Si oxide layer exposed by said patterned mask to form an oxygen-rich portion in said Si oxide layer so that a bottom portion of said Si oxide layer is not oxidized, wherein said oxygen-rich portion has a width;
- after forming said oxygen-rich portion, removing said patterned mask;
- wet etching and removing a portion of said Si oxide layer without etching said oxygen-rich portion until a remaining portion of said Si oxide layer under said oxygen-rich portion has been reduced in width to a width smaller than the width of said oxygen-rich portion;
- after said wet etching, forming an insulating layer on said semiconductor layer;
- removing said Si oxide layer and said oxygen-rich portion to form an opening in said insulating layer;
- and
- forming a gate electrode on said semiconductor layer exposed through the opening.
A method of manufacturing a semiconductor device, comprising:
- forming a first layer on a semiconductor layer;
- forming a second layer on said first layer;
- forming a patterned mask on said second layer, wherein said patterned mask has a width and covers a portion of said second layer, wherein forming said patterned mask on said second layer comprises forming said patterned mask of one of a metal and a photoresist on said second layer;
- etching and removing the portion of said second layer that is not covered by said patterned mask;
- wet etching said first layer to a width which is less than the width of said patterned mask;
- after said wet etching, forming an insulating layer on said semiconductor layer;
- removing said first layer and said second layer to form an opening in said insulating layer;
- and
- forming a gate electrode on a surface of said semiconductor layer exposed through the opening, wherein in said wet etching, etching said first layer is faster than etching said second layer.
Dependencies are inferred from the claim text.