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US 8,899,827 B2Granted
Thermal analysis apparatus and thermal analysis method
AssigneeNetzsch-Gerätebau GmbH
InventorsAlexander Schindler, Juergen Blumm
Life of this patent
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Abstract
A thermal analysis apparatus and method, including a sample space with a sample carrier, and heating devices, and an inert gas. Flow devices generate an inert gas flow to the sample carrier. Getter devices and/or oxygen traps disposed in the inert gas flow remove residual oxygen.
Claims22
A thermal analysis apparatus comprising:
- a sample space,
- a sample carrier and heating devices contained within the sample space,
- flow devices with an inert gas supply for an inert gas, the flow devices being contained within the sample space, and
- at least one getter device for the removal of residual oxygen from the inert gas, the getter device being contained within the sample space,
- wherein the at least one getter device is disposed in the inert gas flow in the flow direction upstream of the sample carrier and a distance apart from the sample carrier, and
- the getter device includes at least one getter carrier for receiving a getter material, the getter carrier and/or the getter material being disposed axially with respect to the sample carrier, and the getter carrier being produced at least from a ceramic material.
3 more elements
A thermal analysis method, wherein a sample carrier and heating devices are surrounded by inert gas in a sample space, wherein an inert gas flow is generated by an inert gas supply in the sample space, characterized in that
- the inert gas flow in the sample space first flows over or past a getter device for the removal of residual oxygen from the inert gas and then to the sample carrier,
- the getter device is disposed a distance a art from the sample carrier,
- at least one getter carrier for receiving a getter material is disposed in the getter device, wherein the getter carrier and/or the getter material are aligned axially with the sample carrier, and
- the getter carrier is produced from a ceramic material.
1 more element
Dependencies are inferred from the claim text.