Dynamic built-in self-test system
AssigneeInternational Business Machines Corporation
InventorsSteven M. Douskey, Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer
Life of this patent
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Abstract
A method of performing a dynamic built-in self-test (BIST). The method includes performing a first test of a circuit on a semiconductor chip. The first test includes a first switch factor. The circuit during the first test is monitored with one or more sensors. A first sensor value of one or more sensors monitoring the circuit is determined. It is also determined whether the first sensor value is within a range of a programmable constant. A second switch factor is determined in response to determining that the first sensor value outside the range of the programmable constant.
Claims13
A method of performing a dynamic built-in self-test (BIST), comprising:
- performing the dynamic BIST with a first BIST of a circuit on a semiconductor chip, the first BIST has a first BIST setting that produces a first switch factor that generates a first parameter condition;
- monitoring the circuit during the first BIST by one or more sensors that measure the first parameter condition;
- collecting sensor data of the one or more sensors, the sensor data being a measurement of the first parameter condition;
- calculating a first sensor value, from the sensor data;
- determining whether the first sensor value has reached a set-point, wherein the set-point is when a sensor value is substantially equal to a programmable constant;
- and
- in response to determining that the first sensor value has not reached the set-point, adjusting the first BIST setting to a second BIST setting which adjusts the first switch factor to a second switch factor that generates a second parameter condition.
A method of determining a programmable constant to compare to a sensor value in a dynamic built-in self-test (BIST) system, comprising:
- performing the dynamic BIST with a first BIST of a circuit on a semiconductor chip, the first BIST has a first BIST setting that produces a first switch factor that generates a first parameter condition and the first BIST produces a first signature;
- determining whether the first signature of the first BIST is equivalent to a first expected signature;
- in response to determining the first signature is equivalent to the first expected signature, collecting sensor data of one or more sensors that measure the first parameter condition, the sensor data being a measurement of the first parameter condition;
- calculating a first sensor value, from the sensor data;
- and
- storing the first sensor value as the programmable constant, in the semiconductor chip.
Dependencies are inferred from the claim text.