Optical inspection method
AssigneeQuanta Computer Inc.
InventorChin-Lin Lin
Life of this patent
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Abstract
An optical inspection method including the following steps is disclosed. A tester is utilized to obtain an image of an inspection object. A target image region of the image is determined. Multiple central coordinates of multiple inspection ranges of a target image region are obtained. The central coordinates are filled to an array, and then the central coordinates are reordered according to relative relationships of the central coordinates to obtain a reordered coordinate array. The reordered coordinate array is compared with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.
Claims4
An optical inspection method, comprising:
- utilizing a tester to obtain an image of an inspection object;
- determining a target image region of the image;
- obtaining a plurality of central coordinates of a plurality of inspection ranges of the target image region;
- filling the central coordinates to an array and reordering the central coordinates according to relative relationships of the central coordinates to obtain a reordered coordinate array;
- and
- comparing the reordered coordinate array with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.
Dependencies are inferred from the claim text.