Compensation scheme for non-volatile memory
AssigneeSanDisk 3D LLC
InventorsYingchang Chen, Pankaj Kalra, Chandrasekhar Gorta
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AssigneeSanDisk 3D LLC
InventorsYingchang Chen, Pankaj Kalra, Chandrasekhar Gorta
Estimating the term…
Methods for performing parallel voltage and current compensation during reading and/or writing of memory cells in a memory array are described. In some embodiments, the compensation may include adjusting a bit line voltage and/or bit line reference current applied to a memory cell based on a memory array zone, a bit line layer, and a memory cell direction associated with the memory cell. The compensation may include adjusting the bit line voltage and/or bit line reference current on a per memory cell basis depending on memory cell specific characteristics. In some embodiments, a read/write circuit for reading and/or writing a memory cell may select a bit line voltage from a plurality of bit line voltage options to be applied to the memory cell based on whether the memory cell has been characterized as a strong, weak, or typical memory cell.
A monolithic three-dimensional integrated circuit, comprising:
A method for operating a monolithic three-dimensional integrated circuit, comprising:
Dependencies are inferred from the claim text.