Multiplex tunable filter spectrometer
AssigneePason Systems Corp.
InventorVidi A. Saptari
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Abstract
The invention provides spectroscopic systems and spectrometers employing an optical interference filter module having a plurality of bandpass regions. In certain embodiments, the systems include a mechanism for wavelength tuning/scanning and wavelength band decoding based on an angular motion of one or more filters. A spectral processing algorithm separates the multiplexed wavelength-scanned bandpass regions and quantifies the concentrations of the analyzed chemical and/or biological species. The spectroscopic system allows for compact, multi-compound analysis, employing a single-element detector for maximum performance-to-cost ratio. The spectroscopic system also allows for high-sensitivity measurement and robust interference compensation.
Claims19
A spectroscopic system comprising:
- an optical filter module comprising one or more optical interference filters configured to receive electromagnetic radiation from an electromagnetic radiation source, the one or more filters comprising a plurality of multiplexed bandpass regions configured to simultaneously transmit multiple wavelength bands of electromagnetic radiation through the filter module;
- and
- an optical detector configured to receive the multiple wavelength bands of electromagnetic radiation simultaneously transmitted through the filter module and to generate one or more electrical signals indicative of electromagnetic radiation intensity as a function of wavelength,
- wherein movement of the optical filter module enables capture, by the optical detector, of a distinct wavelength sweep for each of the plurality of multiplexed bandpass regions.
Dependencies are inferred from the claim text.