Radiation-tolerant overcurrent detection
AssigneeTexas Instruments Incorporated
InventorsCharles Parkhurst, Mark Hamlyn
Life of this patent
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Abstract
Systems and methods for radiation-tolerant overcurrent detection are disclosed. In some embodiments, an integrated circuit may include a plurality of overcurrent detectors, each of the plurality of overcurrent detectors configured to detect a candidate overcurrent event. The integrated circuit may also include a voting circuit coupled to the overcurrent detectors, the voting circuit configured to indicate an overcurrent in response to receiving a selected number of candidate overcurrent events from the overcurrent detectors. At least one of the overcurrent detectors may be subject to detecting the candidate overcurrent in error, at least in part, due to exposure to ionizing radiation.
Claims12
An apparatus comprising:
- an electrical power source;
- a plurality of comparators, each of the plurality of comparators coupled to one of:
- a high-side or a low-side field-effect transistor (FET) of direct current (DC)-to-DC converter, each of the plurality of comparators configured to compare an output voltage with a preset overcurrent threshold voltage, wherein the output voltage is the voltage outputted from the direct current (DC)-to(DC) converter, and each of the plurality of comparators further configured to determine whether an overcurrent event has occurred based, at least in part, upon the comparison;
- and
- a logic circuit coupled to each of the plurality of comparators, the logic circuit configured to indicate the presence of an overcurrent in response to a selected number of the plurality of comparators determining that the overcurrent event has occurred, and the logic circuit further configured to indicate the absence of the overcurrent in response to fewer than the selected number of the plurality of comparators determining that the overcurrent event has occurred,
- wherein the plurality of comparators includes a first comparator, a second comparator, and a third comparator, the selected number of the plurality of comparators includes two or more of the plurality of comparators, and fewer than the selected number of the plurality of comparators includes one or none of the plurality of comparators,
- wherein the logic circuit further includes a first AND gate, a second AND gate, a third AND gate, and an OR gate coupled to:
- an output of the first AND gate, an output of the second AND gate, and an output of the third AND gate,
- wherein an output of the first comparator is coupled to a first input of the first AND gate and to a first input of the second AND gate, an output of the second comparator is coupled to a second input of the first AND gate and to a first input of the third AND gate, and an output of the third comparator is coupled to a second input of the second AND gate and a second input of the third AND gate.
An integrated circuit comprising:
- a plurality of overcurrent detectors, each of the plurality of overcurrent detectors configured to detect a candidate overcurrent event;
- and
- a voting circuit coupled to the plurality of overcurrent detectors, the voting circuit configured to indicate an overcurrent in response to receiving a selected number of candidate overcurrent events from the plurality of overcurrent detectors,
- wherein the plurality of overcurrent detectors includes a first comparator, a second comparator, and a third comparator, and wherein the voting circuit further includes a first AND gate, a second AND gate, a third AND gate, and an OR gate coupled to an output of the first AND gate, an output of the second AND gate, and an output of the third AND gate,
- wherein an output of the first comparator is coupled to a first input of the first AND gate and to a first input of the second AND gate, an output of the second comparator is coupled to a second input of the first AND gate and to a first input of the third AND gate, and an output of the third comparator is coupled to a second input of the second AND gate and a second input of the third AND gate.
Dependencies are inferred from the claim text.