Multichip module with reroutable inter-die communication
AssigneeAltera Corporation
InventorDavid Lewis
Life of this patent
Estimating the term…
Abstract
A multichip module (MCM) has redundant I/O connections between its dice. That is, the number of inter-die I/O connections used is larger than the number of connections ordinarily used to provide connectivity between the dice. Defective connections are discovered through testing after MCM assembly and avoided, with signals being rerouted through good (e.g., not defective) redundant connections. The testing can be done at assembly time and the results stored in nonvolatile memory. Alternatively, the MCM can perform the testing itself dynamically, e.g., at power up, and use the test results to configure the inter-die I/O connections.
Claims19
A method comprising:
- testing a plurality of Input/output (I/O) connections between two cores of a module coupled to a substrate, wherein the plurality of I/O connections includes redundant I/O connections;
- storing defect data, that includes defect locations of the plurality of I/O connections, in nonvolatile memories of each of the two cores;
- and
- rerouting at least one signal from one I/O connection of the plurality of I/O connections to a redundant I/O connection of the redundant I/O connections based on determining that said one I/O connection is defective, in accordance with the stored defect data.
A method, comprising operations of:
- testing a plurality of Input/output (I/O) connections between two cores of a module to identify defective I/O connections, wherein the module includes redundant I/O connections and further includes circuitry for rerouting a signal from the defective I/O connections;
- storing data resulting from the testing in nonvolatile memory, wherein the data includes the identified defective I/O connections;
- transitioning the module to operational mode;
- and
- switching at least one signal from one defective I/O connection of the defective I/O connections to one redundant I/O of the redundant I/O connections based on the data resulting from the testing.
Dependencies are inferred from the claim text.