Compound semiconductor device and method of manufacturing the same
AssigneeFujitsu Limited
InventorsMasahito Kanamura, Kozo Makiyama
Life of this patent
Estimating the term…
Loading patent…
AssigneeFujitsu Limited
InventorsMasahito Kanamura, Kozo Makiyama
Estimating the term…
Two layers of protection films are formed such that a sheet resistance at a portion directly below the protection film is higher than that at a portion directly below the protection film. The protection films are formed, for example, of SiN film, as insulating films. The protection film is formed to be higher, for instance, in hydrogen concentration than the protection film so that the protection film is higher in refractive index the protection film. The protection film is formed to cover a gate electrode and extend to the vicinity of the gate electrode on an electron supplying layer. The protection film is formed on the entire surface to cover the protection film. According to this configuration, the gate leakage is significantly reduced by a relatively simple configuration to realize a highly-reliable compound semiconductor device achieving high voltage operation, high withstand voltage, and high output.
A method of manufacturing a compound semiconductor device, the compound semiconductor device comprising:
Dependencies are inferred from the claim text.