Integrated semiconductor device and wafer level method of fabricating the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsKuei-Sung Chang, Chun-Wen Cheng, Alex Kalnitsky, Chia-Hua Chu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsKuei-Sung Chang, Chun-Wen Cheng, Alex Kalnitsky, Chia-Hua Chu
Estimating the term…
The present disclosure provides one embodiment of a stacked semiconductor device. The stacked semiconductor device includes a first substrate; a first bond pad over the first substrate; a second substrate including a second electrical device fabricated thereon; a second bond pad over the second electrical device over the second substrate, the second bond pad electrically connecting to the second electrical device; a second insulation layer over the second bond pad having a top surface, the second insulation layer being bonded toward the first bond pad of the first substrate; and a through-substrate-via (“TSV”) extending from a surface opposite to the first bond pad through the first substrate and through the top surface of the second insulation layer to the second bond pad.
A method to fabricate a stacked semiconductor device, the method comprising:
A method to fabricate a stacked semiconductor device, the method comprising:
A method to fabricate a stacked semiconductor device, the method comprising:
Dependencies are inferred from the claim text.