Substrate containing aperture and methods of forming the same
AssigneeElectro Scientific Industries, Inc.
InventorsAndy Hooper, Daragh Finn, Tim Webb, Lynn Sheehan, Kenneth Pettigrew, Yu Chong Tai
Life of this patent
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AssigneeElectro Scientific Industries, Inc.
InventorsAndy Hooper, Daragh Finn, Tim Webb, Lynn Sheehan, Kenneth Pettigrew, Yu Chong Tai
Estimating the term…
A method of forming an aperture (e.g., a through via, a blind via, a trench, an alignment feature, etc.) within a substrate includes irradiating a substrate with a laser beam to form a laser-machined feature having a sidewall. The laser-machined feature is then processed to change at least one characteristic (e.g., the sidewall surface roughness, diameter, taper, aspect ratio, cross-sectional profile, etc.) of the laser-machined feature. The laser-machined feature can be processed to form the aperture by performing an isotropic wet-etch process employing an etchant solution containing HNO3, HF and, optionally acetic acid.
A method of forming a through hole via within a substrate, the method comprising:
A method of forming an aperture within a substrate, the method comprising:
Dependencies are inferred from the claim text.