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US 8,894,805 B2Granted
Electron beam plasma source with profiled magnet shield for uniform plasma generation
AssigneeApplied Materials, Inc.
InventorsKallol Bera, Shahid Rauf, Leonid Dorf, Kenneth S. Collins, Ajit Balakrishna, Gary Leray
Life of this patent
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Abstract
A plasma reactor employs an e-beam source to generate plasma, and the e-beam source has a configurable magnetic shield.
Claims19
A plasma reactor for processing a workpiece, comprising:
- a processing chamber comprising a chamber ceiling and a chamber side wall and an electron beam opening in said chamber side wall, a workpiece support pedestal in said processing chamber having a workpiece support surface facing said chamber ceiling and defining a workpiece processing region between said workpiece support surface and said chamber ceiling, said electron beam opening facing said workpiece processing region;
- an electron beam source chamber comprising a source enclosure, said source enclosure defining an electron beam propagation path along a longitudinal direction extending into said workpiece processing region;
- an electromagnet surrounding said source chamber, said source enclosure and said electron beam opening extending along a transverse direction that is non-parallel to said longitudinal direction;
- and
- a shield disposed between said source chamber and said electromagnet, said shield having an edge defining a shield length, said edge having a profile corresponding to a distribution of said shield length along said transverse direction.
2 more elements
Dependencies are inferred from the claim text.