Airflow management for low particulate count in a process tool
AssigneeLam Research Corporation
InventorEric H. Lenz
Life of this patent
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AssigneeLam Research Corporation
InventorEric H. Lenz
Estimating the term…
In various exemplary embodiments described herein, a system and related method to provide airflow management system in a substrate production tool includes a housing to couple the substrate production tool to a fan filter unit to provide filtered air to the housing, a facility connection to couple the substrate production tool to a reduced pressure exhaust mechanism, a substrate transfer section coupled below the housing and in airflow communication with the facility connection, and a substrate process area coupled to the substrate transfer section by one or more substrate transfer slots. A chamber substantially containing the substrate transfer section and the substrate process area is coupled to the housing to receive the filtered air and to the facility connection to provide an exhaust for excess gas flow. The chamber maintains a low pressure in the substrate process area relative to the substrate transfer section.
An airflow management system of a substrate production tool, the system comprising:
An airflow management system of a wafer process tool, the system comprising:
Dependencies are inferred from the claim text.