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US 8,893,565 B2Granted
Apparatus for sensing
AssigneeNokia Corporation
InventorsRichard White, Jani Kivioja
Life of this patent
Estimating the term…
Abstract
Embodiments of the disclosure relate to an apparatus including a first sensor arrangement configured in a first layer; a second sensor arrangement configured in a second layer; wherein the sensor arrangements are configured to vary an input signal in response to a sensed parameter; and the apparatus also including an input configured to receive an input signal and an output configured to provide an output signal that depends on each of the first and second sensor arrangements.
Claims20
An apparatus comprising:
- a first sensor arrangement configured in a first layer;
- a second sensor arrangement configured in a second layer;
- and
- an input configured to receive an input signal and an output configured to provide an output signal that depends on each of the first and second sensor arrangements;
- wherein the sensor arrangements are configured to vary the input signal in response to a sensed parameter;
- and
- wherein the apparatus comprises one or more further layers where a further sensor arrangement is configured in each of the further layers and the output signal depends on each of the first and second sensor arrangements and the further sensor arrangements.
4 more elements
A method of manufacturing an apparatus comprising:
- forming a first sensor arrangement configured in a first layer;
- forming a second sensor arrangement configured in a second layer;
- providing an input configured to receive an input signal and providing an output configured to provide an output signal that depends on each of the first and second sensor arrangements;
- and
- forming one or more further layers where a sensor arrangement is formed in each of the further layers;
- wherein the sensor arrangements are configured to vary the input signal in response to a sensed parameter.
3 more elements
An apparatus comprising:
- a piezo-resistive substrate configured to have a variable resistor that varies in response to a force applied to the apparatus;
- a sensor arrangement comprising at least a first sensor, a second sensor, and a third sensor mounted on the piezo-resistive substrate;
- and
- an input configured to receive an input signal and an output configured to provide an output signal that depends upon the impedance of the piezo-resistive substrate and the parameters sensed by the first sensor, the second sensor, and the third sensor of the sensor arrangement;
- wherein the sensor arrangement is configured to vary the input signal in response to a sensed parameter.
2 more elements
Dependencies are inferred from the claim text.