X-ray tomographic inspection system for the identification of specific target items
AssigneeRapiscan Systems, Inc.
InventorEdward James Morton
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Abstract
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
Claims11
A system for generating a sinogram, comprising:
- a plurality of X-ray source points arranged around a scanning region;
- a first set of detectors arranged to detect X-rays transmitted through the scanning region;
- a second set of detectors arranged to detect X rays scattered from the scanning region;
- and
- a processing system for receiving unattenuated X-ray beam intensity data from the plurality of X-ray source points, for receiving attenuated X-ray beam intensity data from the first set of detectors, and for generating said sinogram from a function of said unattenuated X-ray beam intensity data and attenuated X-ray beam intensity data, wherein said sinogram comprises data arranged in an array with a pixel number along one axis and a source angle, corresponding to one of said plurality of X-ray source points, along a second axis.
Dependencies are inferred from the claim text.