Integrated circuit configuration system and method
AssigneeNVIDIA Corporation
InventorsJames M. Van Dyke, John S. Montrym, Michael B. Nagy, Sean J. Treichler
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AssigneeNVIDIA Corporation
InventorsJames M. Van Dyke, John S. Montrym, Michael B. Nagy, Sean J. Treichler
Estimating the term…
The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method can flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors, including if the die has a defective component. An indication of the defective functional component identification is received. A determination is made if the defective functional component is one of a plurality of similar functional components that can provide the same functionality. The other similar components can be examined to determine if they are parallel components to the defective functional component. The defective functional component is disabled if it is one of the plurality of similar functional components and another component can handle the workflow that would otherwise be assigned to the defective component. Workflow is diverted from the disabled component to other similar functional components.
A computer usable non-transitory storage medium having computer readable program code embodied therein for causing a testing system to implement defective resolution module instructions comprising:
A functional component configuration process comprising:
A processing unit comprising:
Dependencies are inferred from the claim text.