Plasma processing apparatus, electrode temperature adjustment device and electrode temperature adjustment method
AssigneeTokyo Electron Limited
InventorMasao Furuya
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AssigneeTokyo Electron Limited
InventorMasao Furuya
Estimating the term…
Before a substrate is processed in a plasma processing apparatus that inhibits an increase in the temperature of an upper electrode attributable to DC voltage application as well as an increase in the upper electrode temperature attributable to high-frequency power application, a heating medium target temperature to be achieved by a heating medium in order to adjust the upper electrode temperature to a predetermined temperature setting is calculated based upon the levels of the high-frequency power to be applied to the upper electrode and a susceptor (lower electrode) and the DC voltage to be applied to the upper electrode. During the substrate processing, the heating medium, the temperature of which is controlled based upon the target temperature, circulates through a flow passage formed at the upper electrode so as to control the temperature of the upper electrode.
A plasma processing apparatus, comprising:
An electrode temperature adjustment device that adjusts the temperature of a first electrode in a plasma processing apparatus that includes said first electrode and a second electrode disposed inside a processing chamber so as to face opposite each other and executes a specific type of processing on a substrate placed on said second electrode by applying first high-frequency power and a DC voltage to said first electrode and applying second high-frequency power with a frequency lower than the first high-frequency power to said second electrode, comprising:
An electrode temperature adjustment method for adjusting the temperature of a first electrode in a plasma processing apparatus that includes said first electrode and a second electrode disposed inside a processing chamber so as to face opposite each other and executes a specific type of processing on a substrate placed on said second electrode by applying first high-frequency power and a DC voltage to said first electrode and applying second high-frequency power with a frequency lower than the first high-frequency power to said second electrode, comprising:
A plasma processing apparatus, comprising:
Dependencies are inferred from the claim text.