Device characterization system and methods
AssigneeHewlett-Packard Development Company, L. P.
InventorsManish Marwah, Chandrakant Patel, Geoff M. Lyon, Martha L. Lyons, Martin Arlitt, Cullen E. Bash
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Abstract
In an embodiment, a device characterization system includes a sensor to sense an attribute of a device, a processor, and an algorithm executable on the processor to collect time series data of the attribute from the sensor, detect edges in the data, identify clusters from the edges, label the clusters based on input from a supervisor, and estimate device characterization parameters from the clusters.
Claims16
A method of characterizing temporal behavior of a device, comprising:
- collecting time series data for an attribute of the device;
- pre-processing the time series data;
- detecting edges in the time series data;
- arranging groups of similar edges into clusters;
- receiving label input from a supervisor;
- labeling each cluster as being associated with a physical event of the device based on the label input;
- based on the clusters, estimating characterization parameters that characterize normal operation of the device.
A method of characterizing temporal behavior of a device, comprising:
- collecting time series data for an attribute of the device;
- detecting edges in the time series data;
- arranging groups of similar edges into a number of clusters;
- receiving a different number of clusters from a supervisor;
- arranging the groups of similar edges into the different number of clusters;
- labeling each cluster with a label received from the supervisor;
- and
- estimating characterization parameters from the clusters that characterize normal operation of the device.
A device characterization system comprising:
- a sensor to sense an attribute of a device;
- a processor;
- a semi-supervised, characterization algorithm executable on the processor to collect time series data of the attribute from the sensor, detect edges in the data, identify clusters from the edges, label the clusters based on input from a supervisor, and estimate device characterization parameters from the clusters.
Dependencies are inferred from the claim text.