Method of forming a micro-electromechanical system device
AssigneeGeneral Electric Company
InventorsAndrew Joseph Detor, Reed Corderman, Christopher Keimel, Marco Aimi
Life of this patent
Estimating the term…
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AssigneeGeneral Electric Company
InventorsAndrew Joseph Detor, Reed Corderman, Christopher Keimel, Marco Aimi
Estimating the term…
A device includes a substrate (308) and a metallic layer (336) formed over the substrate (308) with a deposition process for which the metallic layer (336) is characterizable as having a pre-determinable as-deposited defect density. As a result of a fabrication process, the defect density of the metallic layer (336) is reduced relative to the pre-determinable as-deposited defect density of the same layer (336) or another layer having like composition and which is formed under like deposition conditions. In a related method, a substrate (308) is provided and a removable layer (330) is formed over the substrate (308). A metallic layer (336) is formed over the removable layer (330) and is patterned and etched to define a structure over the removable layer (330). The removable layer (330) is removed, and the metallic layer (336) is heated for a time beyond that necessary for bonding of a hermetic sealing cap (340) thereover.
A method of forming a micro-electromechanical system (MEMS) device, comprising:
A structure of a micro-electromechanical system (MEMS) device made in accord with a method, comprising:
Dependencies are inferred from the claim text.