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US 8,822,965 B2Granted
Charged particle beam irradiation apparatus
AssigneeSumitomo Heavy Industries, Ltd.
InventorToru Asaba
Life of this patent
Estimating the term…
Abstract
A charged particle beam irradiation apparatus includes: a scanning electromagnet that scans a charged particle beam; and a degrader that is provided on a downstream side of the scanning electromagnet in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam. The degrader is configured to be closer to an upstream side in the scanning direction of the charged particle beam, outward in the scanning direction.
Claims10
A charged particle beam irradiation apparatus comprising:
- a scanning electromagnet that scans a charged particle beam according to a predetermined scan pattern;
- and
- a segmental arch shaped degrader that is provided on a downstream side of the scanning electromagnet extending in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam,
- wherein the degrader is not configured to shape a three-dimensional shape of a portion of a maximum arrival depth of the charged particle beam according to a shape of a tumor portion at a maximum depth.
1 more element
A charged particle beam irradiation apparatus comprising:
- a scanning electromagnet that scans a charged particle beam;
- a segmental arch shaped degrader that is provided on a downstream side of the scanning electromagnet in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam;
- a scatterer that diffuses the charged particle beam that pass through the scatterer;
- and
- a bolus that shapes a three-dimensional shape of a portion of a maximum arrival depth of the charged particle beam according to a shape of a tumor portion at a maximum depth;
- wherein the degrader is configured to be closer to an upstream side in the scanning direction of the charged particle beam, outward in the scanning direction.
3 more elements
Dependencies are inferred from the claim text.