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US 8,819,602 B2Granted
Circuit analyzer systems and methods
AssigneeInfineon Technologies AG
InventorGeorg Georgakos
Life of this patent
Estimating the term…
Abstract
Structures of a circuit are identified. Voltages are propagated to the identified structures. Additionally, internal node voltages for the identified structures are obtained. Asymmetrical operating conditions are identified.
Claims20
A circuit analyzer system comprising:
- a structure identification component configured to identify structures of a circuit that have a substantial impact on circuit performance;
- a voltage propagation component configured to propagate voltages to the identified structures of the circuit;
- and
- a matching component configured to obtain internal node voltages for the structures and to identify asymmetrical operating conditions for the structures based on the propagated voltages.
1 more element
A method of performing circuit design verification, the method comprising:
- identifying structures of a circuit that have a substantial impact on circuit performance by using a computer;
- propagating voltages to the identified structures by assigning propagated voltages to the identified structures according to propagation rules for each mode of one or more operating modes;
- evaluating node voltages for internal nodes associated with the identified structures according to the propagated voltages and the propagation rules;
- and
- identifying asymmetrical operating conditions for the identified structures according to the evaluated node voltages.
2 more elements
A method of performing circuit design and verification comprising:
- developing tolerance levels for symmetrical structures, wherein the tolerance levels specify an amount of symmetry for the symmetrical structures and the symmetrical structures substantially impact performance of the circuit;
- designing a circuit having the symmetrical structures;
- automatically generating a symmetry verification report, wherein the verification report identifies asymmetrical operating conditions related to the symmetrical structures by using a computer;
- and
- modifying the circuit to correct the identified asymmetrical operating conditions.
2 more elements
Dependencies are inferred from the claim text.