Test and measurement instrument and method of switching waveform display styles

A digital oscilloscope, comprising:

• input channels for receiving analog input data streams applied to said digital oscilloscope;
• acquisition circuits, coupled to respective ones of said input channels of said digital oscilloscope, each of said acquisition circuits including an A/D converter, configured to acquire one or more of said analog input data streams, and to generate peak detect digital data samples and unfiltered data samples and lowpass filtered data samples from one or more of said analog input data streams;
• input circuits configured to receive input from a user to change an amount of lowpass filtering applied to one or more of said analog input data streams;
• and
• a display unit having first and second modes, the first mode displaying a first combined waveform in which the peak detect digital signal data samples are overlaid with the unfiltered data samples, and the second mode displaying a second combined waveform in which the peak detect digital signal data samples are overlaid with the lowpass filtered data samples, the display unit being configured to change an intensity of pixels associated with the peak detect digital data samples based on the proximity to pixels associated with the lowpass filtered data samples for a given input channel;
• wherein said display unit includes:
• processing circuits configured to convert waveform data associated with the peak detect data samples, unfiltered data samples and the lowpass filtered data samples into the first or second combined waveform display images;
• a memory to store data representative of the first or second combined waveform display images;
• and
• a display device configured to display the waveform display images by automatically selecting the first or second m responsive to a user selection between the lowpass filtered data samples and the unfiltered data samples.