Position measurement method, position measurement device, and program
AssigneeTopcon Corporation
InventorsTetsuji Anai, Nobuo Kochi, Nobuyuki Fukaya
Life of this patent
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AssigneeTopcon Corporation
InventorsTetsuji Anai, Nobuo Kochi, Nobuyuki Fukaya
Estimating the term…
A position measurement method includes an exterior orientation parameter correcting step S11 for correcting exterior orientation parameters calculated in a step S10, based on difference between photographing timing of an image and obtaining timing of a photographing position and/or a photographing posture measured outside, a bundle-adjusting step S12 for simultaneously adjusting a bundle of the exterior orientation parameters of one or more images and three-dimensional coordinates of characteristic points, based on the exterior orientation parameters corrected by the step S11, a three-dimensional coordinate calculating step S13 for calculating three-dimensional coordinates of characteristic points subsequently detected in an area in which the density of the characteristic points is decreased, based on the exterior orientation parameters adjusted bundle thereof, and a repeating step for repeating processing from the steps S10 to S13 until the image becomes a final image.
A position measurement method comprising:
A non-transitory recording medium containing a program for running the following steps to a computer, the steps comprising:
A position measurement device comprising:
A position measurement method comprising:
Dependencies are inferred from the claim text.