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US 8,806,764 B1Granted
Expandable collet and metrology target
AssigneeThe Boeing Company
InventorMichael J. Tanay
Life of this patent
Estimating the term…
Abstract
An apparatus comprises a collet, and a metrology target mounted at a first end of the collet. The target provides a reference point at a known distance from a reference point on the on the collet.
Claims20
Apparatus comprising:
- a collet;
- and
- a metrology target mounted at a first end of the collet, the target providing a reference point at a known distance from a reference point on the on the apparatus.
A determinant assembly system comprising:
- a part having a determinant assembly hole;
- a collet that fits tightly within the hole;
- and
- a metrology target mounted at a first end of the collet, the target providing a reference point at a known distance from a centerline of the collet.
1 more element
A method of measuring a hole location with respect to a reference position, the method comprising:
- fitting an expandable collet tightly in the hole;
- mounting a metrology target to the collet at a fixed distance from a centerline of the hole;
- and
- measuring distance from the target to the reference position.
1 more element
Dependencies are inferred from the claim text.