System and methods for reasonable functional verification of an integrated circuit design
AssigneeAtrenta, Inc.
InventorsMohamad Shaker Sarwary, Maher Mneimneh
Life of this patent
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AssigneeAtrenta, Inc.
InventorsMohamad Shaker Sarwary, Maher Mneimneh
Estimating the term…
A system and methods for reasonable formal verification provides a user with coverage information that is used for verification signoff. The coverage is calculated based on formal analysis techniques and is provided to the user in terms of design-centric metrics rather than formal-centric metrics. Design-centric metrics include the likes of a number of reads from or writes to memories and a number of bit changes for counters, among many others. Accordingly, a setup for failure (SFF) function and a trigger the failure (TTF) function take place. During SFF formal analysis is applied in an attempt to reach a set of states close enough to suspected failure states. During TTF formal analysis is applied, starting from the SFF states, to search for a state violating a predetermined property. If results are inconclusive the user is provided with a design-centric coverage metric that can be used in signoff.
A method implemented in a programmable system for reasonable functional verification of a design of an integrated circuit (IC), the method comprising:
A system for reasonable functional verification of a design of an integrated circuit (IC), the system comprising:
Dependencies are inferred from the claim text.